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Joint Test Action Group
Results: 911

#	Item
671	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for January 18th, 2005 9:00AM-11:00AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-02-14 07:00:53 Joint Test Action Group Automatic test pattern generation Technology Electronics manufacturing Electronic engineering Electronics
672	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for November 14th, 2006 8:00 AM – 10:00 AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-11-27 17:19:26 Electronics Technology Measurement DBm Joint Test Action Group Electromagnetic interference
673	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for October 3rd, 2008 8:00 – 9:00 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-10-06 12:58:03 IEEE standards Technology Joint Test Action Group Standards organizations Cron Differential Institute of Electrical and Electronics Engineers Attribute grammar Boundary scan description language Computing Electronics manufacturing Electronics
674	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for April 19th, 2006 8:00AM-9:30AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:20:47 Electronics Cron Joint Test Action Group Minutes Regular expression IEEE Standards Association Meeting IEEE standards Computing Formal languages
675	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for October 13th, 2008 8:00 – 9:00 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-11-03 08:12:10 Cron Joint Test Action Group Minutes Technology Computing Electronics Electronics manufacturing
676	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for May 22nd, 2007 7:30 AM – 8:30 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-06-12 11:15:11 Boundary scan description language Joint Test Action Group Electromagnetism Boundary scan Attribute Electronics manufacturing Electronics Technology
677	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for April 24th , 2007 7:30 AM – 8:40 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-05-01 10:56:38 Electronic engineering Boundary scan description language Boundary scan Joint Test Action Group Minutes Cron Electronics manufacturing Electronics Technology
678	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for March 11th, 2008 8:00 – 9:00 AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-03-17 15:07:45 Embedded systems Cron Joint Test Action Group Technology Computing Electronics manufacturing Electronics
679	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for September 25th, 2006 8:00AM-10:00AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-10-09 16:13:34 Electronics IMP programming language Minutes Cron Agenda Joint Test Action Group Meetings Parliamentary procedure Computing
680	entity MSTDEV is generic (PHYSICAL_PIN_MAP : string := "dip24"); port( Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-04-25 10:41:58 Electronics manufacturing Joint Test Action Group Technology

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